Chlpík, J., Koleda, M., & Držík, M. TIME RESOLVED PHOTOTHERMAL DEFLECTION MEASUREMENT OF SEMICONDUCTOR MATERIALS THERMAL PARAMETERS.
Chicago Style (17th ed.) CitationChlpík, Juraj, Martin Koleda, and Milan Držík. TIME RESOLVED PHOTOTHERMAL DEFLECTION MEASUREMENT OF SEMICONDUCTOR MATERIALS THERMAL PARAMETERS.
MLA (9th ed.) CitationChlpík, Juraj, et al. TIME RESOLVED PHOTOTHERMAL DEFLECTION MEASUREMENT OF SEMICONDUCTOR MATERIALS THERMAL PARAMETERS.
Warning: These citations may not always be 100% accurate.


