APA (7th ed.) Citation

Nágl, V., & Hallén, A. Traps in Proton Irradiated Silicon Characterized by Deep Level Transient Spectroscopy.

Chicago Style (17th ed.) Citation

Nágl, Viliam, and Anders Hallén. Traps in Proton Irradiated Silicon Characterized by Deep Level Transient Spectroscopy.

MLA (9th ed.) Citation

Nágl, Viliam, and Anders Hallén. Traps in Proton Irradiated Silicon Characterized by Deep Level Transient Spectroscopy.

Warning: These citations may not always be 100% accurate.