Traps in Proton Irradiated Silicon Characterized by Deep Level Transient Spectroscopy
| Main Authors: | , |
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| Format: | Article |
| Language: | Slovak English |
| PhysicalDescription: | Grafy 3, tab. 1, lit. 17 zázn. v angl. |
| ISSN: | 0013-578X |
| Subjects: |
| Physical Description: | Grafy 3, tab. 1, lit. 17 zázn. v angl. |
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| ISSN: | 0013-578X |
