Kinder, R., & Weber, B. The Use of a Four Point Probe for Profiling of Submicron Layers.
Chicago Style (17th ed.) CitationKinder, R., and B. Weber. The Use of a Four Point Probe for Profiling of Submicron Layers.
MLA (9th ed.) CitationKinder, R., and B. Weber. The Use of a Four Point Probe for Profiling of Submicron Layers.
Warning: These citations may not always be 100% accurate.
