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|a Kinder, R.
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|a The Use of a Four Point Probe for Profiling of Submicron Layers
|c R. Kinder, B. Weber
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|b Grafy 3, sch. 2, tab. 1, lit. 10 zázn. v angl., slov.
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|a Weber, B.
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|t Elektrotechnický časopis
|g Roč. 44, č. 8 (1993), s. 233-237
|x 0013-578X
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