Sulek, K., & Havlík, T. Microscopic study of partially leached chalcopyrite using high frequency field.
Chicago Style (17th ed.) CitationSulek, K., and Tomáš Havlík. Microscopic Study of Partially Leached Chalcopyrite Using High Frequency Field.
MLA (9th ed.) CitationSulek, K., and Tomáš Havlík. Microscopic Study of Partially Leached Chalcopyrite Using High Frequency Field.
Warning: These citations may not always be 100% accurate.
