APA (7th ed.) Citation

Dillinger, J., & Dillingerová, M. ELLIPSOMETRIC CHARACTERIZATION OF OXIDE LAYERS ON SILICON SUBSTRATE.

Chicago Style (17th ed.) Citation

Dillinger, Juraj, and Marta Dillingerová. ELLIPSOMETRIC CHARACTERIZATION OF OXIDE LAYERS ON SILICON SUBSTRATE.

MLA (9th ed.) Citation

Dillinger, Juraj, and Marta Dillingerová. ELLIPSOMETRIC CHARACTERIZATION OF OXIDE LAYERS ON SILICON SUBSTRATE.

Warning: These citations may not always be 100% accurate.