Klapetek, P., Ohlídal, I., Franta, D., Bonanni, A., Stifter, D., Sitter, H., & Montaigne-Ramil, A. ATOMIC FORCE MICROSCOPY CHARACTERIZATION OF ZnTe EPITAXIAL FILMS.
Chicago Style (17th ed.) CitationKlapetek, P., Ivan Ohlídal, D. Franta, A. Bonanni, D. Stifter, H. Sitter, and A. Montaigne-Ramil. ATOMIC FORCE MICROSCOPY CHARACTERIZATION OF ZnTe EPITAXIAL FILMS.
MLA (9th ed.) CitationKlapetek, P., et al. ATOMIC FORCE MICROSCOPY CHARACTERIZATION OF ZnTe EPITAXIAL FILMS.
Warning: These citations may not always be 100% accurate.


