APA (7th ed.) Citation

Ohlídal, I., Franta, D., & Klapetek, P. COMBINATION OF OPTICAL METHODS AND ATOMIC FORCE MICROSCOPY AT CHARACTERIZATION OF THIN FILM SYSTEMS.

Chicago Style (17th ed.) Citation

Ohlídal, Ivan, D. Franta, and P. Klapetek. COMBINATION OF OPTICAL METHODS AND ATOMIC FORCE MICROSCOPY AT CHARACTERIZATION OF THIN FILM SYSTEMS.

MLA (9th ed.) Citation

Ohlídal, Ivan, et al. COMBINATION OF OPTICAL METHODS AND ATOMIC FORCE MICROSCOPY AT CHARACTERIZATION OF THIN FILM SYSTEMS.