APA (7th ed.) Citation

Kobayashi, H., Asano, A., Ivanco, J., Takahashi, M., & Nishioka, Y. NEW SPECTROSCOPIC METHOD FOR THE OBSERVATION OF SEMICONDUCTOR INTERFACE STATES AND ITS APPLICATION TO MOS STRUCTURE.

Chicago Style (17th ed.) Citation

Kobayashi, H., A. Asano, J. Ivanco, M. Takahashi, and Y. Nishioka. NEW SPECTROSCOPIC METHOD FOR THE OBSERVATION OF SEMICONDUCTOR INTERFACE STATES AND ITS APPLICATION TO MOS STRUCTURE.

MLA (9th ed.) Citation

Kobayashi, H., et al. NEW SPECTROSCOPIC METHOD FOR THE OBSERVATION OF SEMICONDUCTOR INTERFACE STATES AND ITS APPLICATION TO MOS STRUCTURE.