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Built-in self-test quality assessment using hardware fault emulation in FPGAs

Bibliographic Details
Main Authors: Parreira, Abílio Mendes (Author), Teixeira, Joao Paulo (Author), Santos, Marcelino Bicho dos (Author)
Format: Article
Language:English
PhysicalDescription:Grafy, sch., tab.
ISSN:1335-9150
Subjects:
programovateľné hradlové polia
emulácia
testovanie
hardvér
kvalita
Description
Item Description:Biogr. údaje
Physical Description:Grafy, sch., tab.
ISSN:1335-9150
Bibliography:Bibliogr. odkazy

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