Depth Profiling of Shallow Boron-Doped p-n Junctions in Silicon

Bibliographic Details
Main Authors: Galisová, Adriana, 1969- (Author), Breza, Juraj, 1951- (Author), Kinder, Rudolf (Author), Kocanda, Jozef (Author)
Format: Article
Language:Slovak
English
PhysicalDescription:Obr. 4, lit. 5 zázn. v angl.
ISSN:0013-578X
Subjects:
Description
Item Description:Životopisné údaje
Physical Description:Obr. 4, lit. 5 zázn. v angl.
ISSN:0013-578X