Influence of the defect density on electrical resistivity of thin metallic films
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | Slovak English |
| PhysicalDescription: | Obr. 5. Res. angl., rus. |
| Subjects: |
Similar Items
Eckertová, L.: Physics of Thin Films /Fyzika tenkých vrstiev./
by: Tvarožek, Vladimír, 1943-, et al.
by: Tvarožek, Vladimír, 1943-, et al.
Annealing effect in amorphaus HoCo thin films
by: Goscianska, I., et al.
by: Goscianska, I., et al.
Influence of the specularity parameter P on the classical size-effect in thin metallic films
by: Khater, F., et al.
by: Khater, F., et al.
Some optical and electrical properties of thin films deposited by the plasma polymerization method
by: Janča, J., et al.
by: Janča, J., et al.
