Comparison of X-ray line profile and dip test measurements of internal stresses during high temperature creep of copper

Bibliographic Details
Main Authors: Milička, Karel (Author), Dobeš, Ferdinand (Author), Zehetbauer, Michael (Author), Schafler, Erhard (Author)
Format: Article
Language:Slovak
English
PhysicalDescription:Obr.
ISSN:0023-432X
Subjects:
Description
Physical Description:Obr.
ISSN:0023-432X
Bibliography:Bibliogr. odkazy
Res. angl., čes.