Design and test technology for dependable systems-on-chip

Bibliographic Details
Other Authors:	Ubar, Raimund, 1941- (etd), Raik, Jaan, 1972- (Editor), Vierhaus, Heinrich Theodor, 1951- (Editor)
Format:	Book
Language:	English
PhysicalDescription:	xxvi, 550 s. grafy, ilustr., sch., tab. 29 cm
Published:	Hershey New York Information Science Reference c2011
ISBN:	9781609602123 (viaz.)
Subjects:	elektronické obvody Electronic circuits integrované obvody Integrated circuits digitálne obvody Digital circuits procesory Processors modelovanie a simulácia Modeling and simulation kolektívne monografie Collective monographs

Description
Physical Description:	xxvi, 550 s. grafy, ilustr., sch., tab. 29 cm
ISBN:	9781609602123 (viaz.)
Bibliography:	Bibliogr.: s. 494-533 ; bibliogr. odkazy ; reg.

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