Skip to content
Book Bag:
0
items
(Full)
Login
Language
English
Slovak
Catalog
Catalog Books
Articles
Catalog ONDV
Catalog OND
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
X-RAY DIFFRACTION DETERMINATIO...
Cite this
Print
Export Record
Export to MARC
Export to BibTeX
Export to Jednoduchý textový výpis
Export to ISBD (text)
Export to Citácia ISO 690 (HTML)
Export to Citácia ISO 690 (.doc)
Add to Book Bag
Remove from Book Bag
Permanent link
X-RAY DIFFRACTION DETERMINATION OF STRUCTURAL CHANGES OF DIAMOND THIN FILMS PREPARED AT VARIOUS SUBSTRATE TEMPERATURES
Bibliographic Details
Main Author:
Červeň, Ivan, 1933-
(Author)
Format:
Article
Language:
English
ISBN:
8022715840
Pozri predplatné
Predplatné
Kliknite na „Pozri predplatné“.
Holdings
Description
Similar Items
Staff View
Similar Items
DETECTION OF CRYSTALLINE PHASES IN THIN DIAMOND FILMS BY X-RAY DIFFRACTION
by: Červeň, Ivan, 1933-
PROPERTIES AND PREPARATION OF DIAMOND THIN FILMS FOR INDUSTRIAL APPLICATIONS
by: Marton, Marián
SYNTHESIS AND ELECTRICAL PROPERTIES OF THIN FILMS OF FULLERITES ON THE VARIOUS SUBSTRATES
by: Oboňa, Vincenc J., et al.
DIAMOND THIN FILM GROWTH BY HF CVD METHOD AT DIFFERENT SUBSTRATE BIAS
by: Pavlov, Jozef
DIAMOND THIN LAYERS AND COATINGS
by: Šatka, Alexander, 1960-, et al.