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SIMS DEPTH PROFILING OF METALL...
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SIMS DEPTH PROFILING OF METALLIZATION CONTACT LAYERS FOR AlGaN/GaN HETEROSTRUCTURES
Bibliographic Details
Main Authors:
Vincze, A.
(Author)
,
Vanko, G.
(Author)
,
Bruncko, J.
(Author)
,
Držík, M.
(Author)
,
Michalka, M.
(Author)
,
Vallo, Martin, 1984-
(Author)
,
Lalinský, T. (elektrotechnik)
(Author)
Format:
Article
Language:
English
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