IDENTIFICATION OF DOMINANT DEFECTS IN NITROGEN-DOPED CZOCHRALSKI-GROWN SILICON USING CAPACITANCE MEASUREMENT TECHNIQUES

Bibliographic Details
Main Authors:	Bobula, J. (Author), Harmatha, Ladislav, 1948- (Author), Stuchlíková, Ľubica, 1967- (Author), Ťapajna, Milan, 1977- (Author)
Format:	Article
Language:	English

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