OFSTATISTICAL AND FRACTAL PROPERTIES OF SEMICONDUCTOR SURFACE ROUGHNESS

Bibliographic Details
Main Authors:	Pinčík, E. (Author), Kobayashi, H. (Author), Jurečková, M. (Author), Madani, M. (Author), Takahashi, M. (Author), Jurečka, S. (Author)
Format:	Article
Language:	English

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