Pinčík, E., Kobayashi, H., Jurečková, M., Madani, M., Takahashi, M., & Jurečka, S. OFSTATISTICAL AND FRACTAL PROPERTIES OF SEMICONDUCTOR SURFACE ROUGHNESS.
Chicago Style (17th ed.) CitationPinčík, E., H. Kobayashi, M. Jurečková, M. Madani, M. Takahashi, and S. Jurečka. OFSTATISTICAL AND FRACTAL PROPERTIES OF SEMICONDUCTOR SURFACE ROUGHNESS.
MLA (9th ed.) CitationPinčík, E., et al. OFSTATISTICAL AND FRACTAL PROPERTIES OF SEMICONDUCTOR SURFACE ROUGHNESS.
Warning: These citations may not always be 100% accurate.


