Defects formation in boron implanted silicon during rapid isothermal annealing

Bibliographic Details
Main Authors: Lenhard, R. (elektrotechnik) (Author), Luby, Štefan, 1941- (Author)
Format: Article
Language:English
PhysicalDescription:Obr. 8, res. angl., rus., lit. 9 zázn. v angl.
ISSN:0323-0465
Subjects:
Description
Physical Description:Obr. 8, res. angl., rus., lit. 9 zázn. v angl.
ISSN:0323-0465