The influence of radiation stimulated gettering on the reliability of silicon device structures

Bibliographic Details
Main Authors:	Konakova, R. V. (Author), Sinkevič, V. F. (Author), Pavlenko, A. A. (Author)
Format:	Article
Language:	Slovak English
Subjects:	zariadenia polovodičové tranzistory Si getrovanie beta žiarenie články z novín a časopisov

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