Determination of Carrier Concentration Profile of MOS (pn) Structures by the Capacitance Technique

Bibliographic Details
Main Authors:	Kinder, Rudolf (Author), Hulényi, Ladislav, 1938- (Author)
Format:	Article
Language:	Slovak English
Subjects:	štruktúry MOS priechody p-n reaktancia kapacitná články z novín a časopisov

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