APA (7th ed.) Citation

Kinder, R., & Hulényi, L. Determination of Carrier Concentration Profile of MOS (pn) Structures by the Capacitance Technique.

Chicago Style (17th ed.) Citation

Kinder, Rudolf, and Ladislav Hulényi. Determination of Carrier Concentration Profile of MOS (pn) Structures by the Capacitance Technique.

MLA (9th ed.) Citation

Kinder, Rudolf, and Ladislav Hulényi. Determination of Carrier Concentration Profile of MOS (pn) Structures by the Capacitance Technique.

Warning: These citations may not always be 100% accurate.