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Determination of Carrier Concentration Profile of MOS (pn) Structures by the Capacitance Technique

Bibliographic Details
Main Authors: Kinder, Rudolf (Author), Hulényi, Ladislav, 1938- (Author)
Format: Article
Language:Slovak
English
Subjects:
štruktúry MOS
priechody p-n
reaktancia kapacitná
články z novín a časopisov
Description
Item Description:Životopisné údaje
Physical Description:Obr. 4, lit. 7 zázn. v angl.
ISSN:0013-578X

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