Skip to content
Book Bag:
0
items
(Full)
Login
Language
English
Slovak
Catalog
Catalog Books
Articles
Catalog ONDV
Catalog OND
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
Edge Effects on Contact Resist...
Cite this
Print
Export Record
Export to MARC
Export to BibTeX
Export to Jednoduchý textový výpis
Export to ISBD (text)
Export to Citácia ISO 690 (HTML)
Export to Citácia ISO 690 (.doc)
Add to Book Bag
Remove from Book Bag
Permanent link
Edge Effects on Contact Resistance Measurement by Transmission Line Model Method
Bibliographic Details
Main Authors:
Hudec, L.
(Author)
,
Macháč, P.
(Author)
Format:
Article
Language:
Slovak
English
Subjects:
odpor prechodový kontaktový
články z novín a časopisov
Pozri predplatné
Predplatné
Kliknite na „Pozri predplatné“.
Holdings
Description
Similar Items
Staff View
Similar Items
Contact Resistance Measurement by TLM Method
by: Macháč, Petr, et al.
Ion implanted ohmic contacts to AlGaN/GaN structures
by: Boratyński, Bogusław, et al.
Stará papierová kartotéka už je "out"
Non Contact Measurement of Resistivity by Measuring Circuits Parameters
by: Bartušek, K., et al.
Primary Standards of Electrical Resistance
by: Harich, Ľubomír
