APA (7th ed.) Citation

Kok, K., & Leake, J. Microstructural characterisation of multilayer material by combination of X-ray diffraction and electron microscopy.

Chicago Style (17th ed.) Citation

Kok, K.Y, and J.A Leake. Microstructural Characterisation of Multilayer Material by Combination of X-ray Diffraction and Electron Microscopy.

MLA (9th ed.) Citation

Kok, K.Y, and J.A Leake. Microstructural Characterisation of Multilayer Material by Combination of X-ray Diffraction and Electron Microscopy.

Warning: These citations may not always be 100% accurate.