An automatic measurement system with Hall profiling and a four point probe for characterization of semiconductors

Bibliographic Details
Main Authors:	Kinder, Rudolf, 1940- (Author), Hudec, Ladislav (Author), Blažíček, Marian 1978- (Author)
Format:	Article
Language:	Slovak English
Subjects:	polovodiče automatické meracie systémy Hallov jav

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