APA (7th ed.) Citation

Kinder, R., Hudec, L., & Blažíček, M. An automatic measurement system with Hall profiling and a four point probe for characterization of semiconductors.

Chicago Style (17th ed.) Citation

Kinder, Rudolf, Ladislav Hudec, and Marian Blažíček. An Automatic Measurement System with Hall Profiling and a Four Point Probe for Characterization of Semiconductors.

MLA (9th ed.) Citation

Kinder, Rudolf, et al. An Automatic Measurement System with Hall Profiling and a Four Point Probe for Characterization of Semiconductors.

Warning: These citations may not always be 100% accurate.