An automatic measurement system with Hall profiling and a four point probe for characterization of semiconductors
| Main Authors: | , , |
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| Format: | Article |
| Language: | Slovak English |
| Subjects: |
| Item Description: | Biogr. údaje |
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| Physical Description: | Graf, sch. |
| Bibliography: | Bibliogr. odkazy |
| ISSN: | 1335-3632 |
