Skip to content
Book Bag:
0
items
(Full)
Login
Language
English
Slovak
Catalog
Catalog Books
Articles
Catalog ONDV
Catalog OND
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
Measuring CADeT performance by...
Cite this
Print
Export Record
Export to MARC
Export to BibTeX
Export to Jednoduchý textový výpis
Export to ISBD (text)
Export to Citácia ISO 690 (HTML)
Export to Citácia ISO 690 (.doc)
Add to Book Bag
Remove from Book Bag
Permanent link
Measuring CADeT performance by means of FITTest-BENCH06 benchmark circuits
Bibliographic Details
Main Authors:
Strnadel, Josef, 1912-1986
(Author)
,
Pečenka, Tomáš
(Author)
,
Kotásek, Zdeněk, 1947-
(Author)
Format:
Article
Language:
Slovak
English
Subjects:
testovacie obvody
sekvenčné obvody
testovateľnosť obvodov
Pozri predplatné
Predplatné
Kliknite na „Pozri predplatné“.
Holdings
Description
Similar Items
Staff View
Similar Items
Testability analysis and improvements of register-transfer level digital circuits
by: Strnadel, Josef, 1912-1986
Logické systémy sekvenčné obvody
by: Frištacký, Norbert, 1931-2006
Published: (1981)
Logické systémy návody na cvičenia
by: Bača, Ján
Published: (1980)
Logické systémy sekvenčné obvody
by: Frištacký, Norbert, 1931-2006
Published: (1980)
A flip-flop matching engine to verify sequential optimizations
by: Rahim, Solaiman, et al.