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Microscale characterisation of...
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Microscale characterisation of optical and electrical parameters of UV GaN planar detectors
Bibliographic Details
Main Authors:
Szyszka, Adam, 1979-
(Author)
,
Paszkiewicz, Bogdan
(Author)
,
Macherzyński, Wojciech, 1980-
(Author)
,
Paszkiewicz, Regina
(Author)
,
Tłaczała, Marek
(Author)
Format:
Article
Language:
Slovak
English
PhysicalDescription:
Grafy, fotogr.
ISSN:
1335-3632
Subjects:
fotorezistory
nitrid gália
epitaxné vrstvy
ultrafialové detektory
optické vlastnosti materiálov
elektrické vlastnosti materiálov
experimentálny výskum
štúdie
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