Skip to content
Book Bag:
0
items
(Full)
Login
Language
English
Slovak
Catalog
Catalog Books
Articles
Catalog ONDV
Catalog OND
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
TEST STRATEGIES FOR EMBEDDED A...
Cite this
Print
Export Record
Export to MARC
Export to BibTeX
Export to Jednoduchý textový výpis
Export to ISBD (text)
Export to Citácia ISO 690 (HTML)
Export to Citácia ISO 690 (.doc)
Add to Book Bag
Remove from Book Bag
Permanent link
TEST STRATEGIES FOR EMBEDDED ADC CORES IN A SYSTEM-ON-CHIP, A CASE STUDY
Bibliographic Details
Main Authors:
Novak, Franc
(Author)
,
Mrak, Peter
(Author)
,
Biasizzo, Anton
(Author)
Format:
Article
Language:
Slovak
English
Pozri predplatné
Predplatné
Kliknite na „Pozri predplatné“.
Holdings
Description
Similar Items
Staff View
Similar Items
MEASURING STATIC PARAMETERS OF EMBEDDED ADC CORE
by: Biasizzo, Anton, et al.
ON MEASUREMENT UNCERTAINTY OF ADC NONLINEARITIES IN OSCILLATION-BASED TEST
by: Biasizzo, Anton, et al.
Functional testing of processor cores in FPGA-based applications
by: Wegrzyn, Mariusz, et al.
Histogram testing of ADC by the exponential signal
by: Holcer, Roland, 1976-, et al.
A NEW CONCURRENT CHECKPOINT MECHANISM FOR EMBEDED MULTI-CORE SYSTEMS
by: Liao, Jianwei
