Skip to content
Book Bag:
0
items
(Full)
Login
Language
English
Slovak
Catalog
Catalog Books
Articles
Catalog ONDV
Catalog OND
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
ANALYSIS OF THIN FILMS BY OPTI...
Cite this
Print
Export Record
Export to MARC
Export to BibTeX
Export to Jednoduchý textový výpis
Export to ISBD (text)
Export to Citácia ISO 690 (HTML)
Export to Citácia ISO 690 (.doc)
Add to Book Bag
Remove from Book Bag
Permanent link
ANALYSIS OF THIN FILMS BY OPTICAL MULTI-SAMPLE METHODS
Bibliographic Details
Main Authors:
Franta, D.
(Author)
,
Ohlídal, Ivan, 1945-
(Author)
Format:
Article
Language:
Slovak
English
Pozri predplatné
Predplatné
Kliknite na „Pozri predplatné“.
Holdings
Description
Similar Items
Staff View
Similar Items
COMBINATION OF OPTICAL METHODS AND ATOMIC FORCE MICROSCOPY AT CHARACTERIZATION OF THIN FILM SYSTEMS
by: Ohlídal, Ivan, 1945-, et al.
ELLIPSOMETRY OF THIN FILMS
by: Ohlídal, Ivan, 1945-, et al.
MATRIX FORMALISM FOR IMPERFECT THIN FILMS
by: Ohlídal, Ivan, 1945-, et al.
OPTICAL CONSTANTS OF ZnTe AND ZnSe EPITAXIAL THIN FILMS
by: Franta, D., et al.
THIN FILM SOLAR CELLS AND THEIR OPTICAL PROPERTIES
by: Pinčík, E., et al.
