Trnovec, J., Lukáč, P., Juráni, R., & Lányi, L. Effect of Si wafer dry etching on spectrally resolved emission of CCl4 plasma ; J. Trnovec, P. Lukáč, R. Juráni, L. Lányi.
Chicago Style (17th ed.) CitationTrnovec, J., P. Lukáč, R. Juráni, and L. Lányi. Effect of Si Wafer Dry Etching on Spectrally Resolved Emission of CCl4 Plasma ; J. Trnovec, P. Lukáč, R. Juráni, L. Lányi.
MLA (9th ed.) CitationTrnovec, J., et al. Effect of Si Wafer Dry Etching on Spectrally Resolved Emission of CCl4 Plasma ; J. Trnovec, P. Lukáč, R. Juráni, L. Lányi.
Warning: These citations may not always be 100% accurate.


