Kinder, R., Srnánek, R., Walachová, J., Hulényi, L., Tlaczala, M., Ściana, B., & Radziewicz, D. Determination of carrier profiles on bevelled GaAs structures by PCIV method.
Chicago Style (17th ed.) CitationKinder, Rudolf, Rudolf Srnánek, Jarmila Walachová, Ladislav Hulényi, Marek Tlaczala, Beata Ściana, and Damian Radziewicz. Determination of Carrier Profiles on Bevelled GaAs Structures by PCIV Method.
MLA (9th ed.) CitationKinder, Rudolf, et al. Determination of Carrier Profiles on Bevelled GaAs Structures by PCIV Method.
Warning: These citations may not always be 100% accurate.
