Determination of carrier profiles on bevelled GaAs structures by PCIV method
| Main Authors: | , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| PhysicalDescription: | Grafy |
| ISSN: | 1335-3632 |
| Subjects: |
| Item Description: | Biogr. údaje |
|---|---|
| Physical Description: | Grafy |
| ISSN: | 1335-3632 |
| Bibliography: | Bibliogr. odkazy |


