Determination of carrier profiles on bevelled GaAs structures by PCIV method

Bibliographic Details
Main Authors:	Kinder, Rudolf, 1940- (Author), Srnánek, Rudolf, 1944- (Author), Walachová, Jarmila, 1940- (Author), Hulényi, Ladislav, 1938- (Author), Tlaczala, Marek, 1949- (Author), Ściana, Beata, 1965- (Author), Radziewicz, Damian, 1969- (Author)
Format:	Article
Language:	English
PhysicalDescription:	Grafy
ISSN:	1335-3632
Subjects:	GaAs polovodiče nosiče náboja elektrické merania

DETERMINATION OF CARRIER PROFILES ON BEVELLED GaAs STRUCTURES BY PCIV METHOD by Ściana, Beata, 1965-, Radziewicz, Damian, Walachová, Jarmila, 1940-, Hulényi, Ladislav, Tlaczala, Marek, Kinder, Rudolf, Srnánek, Rudolf

Source of article: Journal of electrical engineering. - Roč. 55, č. 9-10 (2004), s. [261]-264

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