Creep damage distribution in silicon nitride by SLAM

Bibliographic Details
Main Author:	Lofaj, František, 1960- (Author)
Format:	Article
Language:	Slovak English
PhysicalDescription:	Obr.
ISSN:	1335-8987
Subjects:	nitrid kremíka > creep > poruchy > mikroskopia rastrovacia laserová mikroskopia rastrovacia laserová creep články z novín a časopisov

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